An Effective Test Case Generation Method with Fault Detection Capability
Vol. 20, No. 12, pp. 3540-3551, Dec. 1995
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Cite this article
[IEEE Style]
김광현 and 이동호, "An Effective Test Case Generation Method with Fault Detection Capability," The Journal of Korean Institute of Communications and Information Sciences, vol. 20, no. 12, pp. 3540-3551, 1995. DOI: .
[ACM Style]
김광현 and 이동호. 1995. An Effective Test Case Generation Method with Fault Detection Capability. The Journal of Korean Institute of Communications and Information Sciences, 20, 12, (1995), 3540-3551. DOI: .
[KICS Style]
김광현 and 이동호, "An Effective Test Case Generation Method with Fault Detection Capability," The Journal of Korean Institute of Communications and Information Sciences, vol. 20, no. 12, pp. 3540-3551, 12. 1995.
pISSN : 1226 - 4717
eISSN : 2287 - 3880