New Test Generation for Sequential Circuits Based on State Information Learning
Vol. 25, No. 4, pp. 558-565, Apr. 2000
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Cite this article
[IEEE Style]
이재훈 and 송오영, "New Test Generation for Sequential Circuits Based on State Information Learning," The Journal of Korean Institute of Communications and Information Sciences, vol. 25, no. 4, pp. 558-565, 2000. DOI: .
[ACM Style]
이재훈 and 송오영. 2000. New Test Generation for Sequential Circuits Based on State Information Learning. The Journal of Korean Institute of Communications and Information Sciences, 25, 4, (2000), 558-565. DOI: .
[KICS Style]
이재훈 and 송오영, "New Test Generation for Sequential Circuits Based on State Information Learning," The Journal of Korean Institute of Communications and Information Sciences, vol. 25, no. 4, pp. 558-565, 4. 2000.