A Study on IDDQ Test Pattern Generation for Bridging Fault Detection
Vol. 25, No. 12, pp. 1904-1911, Dec. 2000
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Cite this article
[IEEE Style]
배성환, 김대익, 전병실, "A Study on IDDQ Test Pattern Generation for Bridging Fault Detection," The Journal of Korean Institute of Communications and Information Sciences, vol. 25, no. 12, pp. 1904-1911, 2000. DOI: .
[ACM Style]
배성환, 김대익, and 전병실. 2000. A Study on IDDQ Test Pattern Generation for Bridging Fault Detection. The Journal of Korean Institute of Communications and Information Sciences, 25, 12, (2000), 1904-1911. DOI: .
[KICS Style]
배성환, 김대익, 전병실, "A Study on IDDQ Test Pattern Generation for Bridging Fault Detection," The Journal of Korean Institute of Communications and Information Sciences, vol. 25, no. 12, pp. 1904-1911, 12. 2000.