Software REliability Frowth Models considering an Imperfect Debugging environments 


Vol. 29,  No. 6, pp. 589-599, Jun.  2004


PDF
  Abstract

Most models assume the complete debugging environments by requiring a complete software correction in quantitative evaluation of software reliability. But. in many case. new faults are involved in debugging works, for complete software correction is impossible. In this paper. software growth model is proposed about incomplete debugging environments by considering the possibility of new faults involvements. and software faults occurrence status are also mentioned about NHPP by considering software faults under software operation environments and native faults owing to the randomly involved faults in operation before test. While, effective quantitative measurements are derived in software reliability evaluation, applied results are suggested by using actual data, and fitnesswith existing models are also compared and analyzed.

  Statistics
Cumulative Counts from November, 2022
Multiple requests among the same browser session are counted as one view. If you mouse over a chart, the values of data points will be shown.


  Cite this article

[IEEE Style]

J. Lee, K. Lee, C. Kim, S. Nam, "Software REliability Frowth Models considering an Imperfect Debugging environments," The Journal of Korean Institute of Communications and Information Sciences, vol. 29, no. 6, pp. 589-599, 2004. DOI: .

[ACM Style]

Jae-Ki Lee, Kyu-Wuk Lee, Chang-Bong Kim, and Sang-Sik Nam. 2004. Software REliability Frowth Models considering an Imperfect Debugging environments. The Journal of Korean Institute of Communications and Information Sciences, 29, 6, (2004), 589-599. DOI: .

[KICS Style]

Jae-Ki Lee, Kyu-Wuk Lee, Chang-Bong Kim, Sang-Sik Nam, "Software REliability Frowth Models considering an Imperfect Debugging environments," The Journal of Korean Institute of Communications and Information Sciences, vol. 29, no. 6, pp. 589-599, 6. 2004.

Search
(IN TITLE, AUTHOR, ABSTRACT,KEYWORDS)

Advanced Search ▼

POPULAR KEYWORDS
(TOP 10 KEYWORDS)

Recent Publications
(LAST 3 YEARS)






pISSN : 1226 - 4717
eISSN : 2287 - 3880