Disparity estimation using wavelet transformation and reference points 


Vol. 27,  No. 2, pp. 137-145, Feb.  2002


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  Abstract

In the method of 3D modeling, stereo matching method which obtains three dimensional depth information from the two images is taken from the different view points. In general, it is very essential work for the 3D modeling from 2D stereo images to estimate the exact disparity through finding the conjugate pair of pixel from the left and right image. In this paper to solve the problems of the stereo image disparity estimation, we introduce a novel approach method to improve the exactness and efficiency of the disparity. In the first place, we perform a wavelet transformation of the stereo images and set the reference points in the image by the feature-based matching method. This reference points have very high probability over 95%. In the base of these reference points we can decide the size of the variable block searching windows for estimating dense disparity of area based method and perform the ordering constraint to prevent mismatching. By doing this, we could estimate the disparity in a short time and solve the occlusion caused by applying the fixed-sized windows and probable error caused by repeating patterns.

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  Cite this article

[IEEE Style]

Y. Rho, B. Ko, H. Byun, J. Yoo, "Disparity estimation using wavelet transformation and reference points," The Journal of Korean Institute of Communications and Information Sciences, vol. 27, no. 2, pp. 137-145, 2002. DOI: .

[ACM Style]

Yoon-Hyang Rho, Byoung-Chul Ko, Hyeran Byun, and Ji-Sang Yoo. 2002. Disparity estimation using wavelet transformation and reference points. The Journal of Korean Institute of Communications and Information Sciences, 27, 2, (2002), 137-145. DOI: .

[KICS Style]

Yoon-Hyang Rho, Byoung-Chul Ko, Hyeran Byun, Ji-Sang Yoo, "Disparity estimation using wavelet transformation and reference points," The Journal of Korean Institute of Communications and Information Sciences, vol. 27, no. 2, pp. 137-145, 2. 2002.

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pISSN : 1226 - 4717
eISSN : 2287 - 3880