Software Reliability Growth Model with the Testing Effort for Large System 


Vol. 30,  No. 11, pp. 987-994, Nov.  2005


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  Abstract

Most of the proposed SRGMs are required to perfect debugging based on removal of defect as soon as the detection of defects in system tests. But the detected defects are corrected after few days as a fixed time or induced new fault in software under the imperfect debugging environments. Solving these problems, we discussed that the formal software reliability model considered testing-effort for the fault detection and correction of software defects, and then using this model we have estimated of the software reliability closed to practical conditions.

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  Cite this article

[IEEE Style]

J. Lee, J. Lee, S. Nam, "Software Reliability Growth Model with the Testing Effort for Large System," The Journal of Korean Institute of Communications and Information Sciences, vol. 30, no. 11, pp. 987-994, 2005. DOI: .

[ACM Style]

Jae-ki Lee, Jae-jeong Lee, and Sang-sik Nam. 2005. Software Reliability Growth Model with the Testing Effort for Large System. The Journal of Korean Institute of Communications and Information Sciences, 30, 11, (2005), 987-994. DOI: .

[KICS Style]

Jae-ki Lee, Jae-jeong Lee, Sang-sik Nam, "Software Reliability Growth Model with the Testing Effort for Large System," The Journal of Korean Institute of Communications and Information Sciences, vol. 30, no. 11, pp. 987-994, 11. 2005.

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pISSN : 1226 - 4717
eISSN : 2287 - 3880