Terminal-Pair Reliability Evaluation in ATM VP(Virtual Path) Networks
Vol. 33, No. 8, pp. 263-269, Aug. 2008
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Cite this article
[IEEE Style]
J. Lee and Y. Oh, "Terminal-Pair Reliability Evaluation in ATM VP(Virtual Path) Networks," The Journal of Korean Institute of Communications and Information Sciences, vol. 33, no. 8, pp. 263-269, 2008. DOI: .
[ACM Style]
Jun-Hyuk Lee and Young-Hwan Oh. 2008. Terminal-Pair Reliability Evaluation in ATM VP(Virtual Path) Networks. The Journal of Korean Institute of Communications and Information Sciences, 33, 8, (2008), 263-269. DOI: .
[KICS Style]
Jun-Hyuk Lee and Young-Hwan Oh, "Terminal-Pair Reliability Evaluation in ATM VP(Virtual Path) Networks," The Journal of Korean Institute of Communications and Information Sciences, vol. 33, no. 8, pp. 263-269, 8. 2008.