On the Method of Measuring the Mobility using the Microwave by the Hall Effect in the semiconductor
Vol. 8, No. 2, pp. 54-62, Jul. 1983
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Cite this article
[IEEE Style]
Y. N. HEO, "On the Method of Measuring the Mobility using the Microwave by the Hall Effect in the semiconductor," The Journal of Korean Institute of Communications and Information Sciences, vol. 8, no. 2, pp. 54-62, 1983. DOI: .
[ACM Style]
Yeong Nam HEO. 1983. On the Method of Measuring the Mobility using the Microwave by the Hall Effect in the semiconductor. The Journal of Korean Institute of Communications and Information Sciences, 8, 2, (1983), 54-62. DOI: .
[KICS Style]
Yeong Nam HEO, "On the Method of Measuring the Mobility using the Microwave by the Hall Effect in the semiconductor," The Journal of Korean Institute of Communications and Information Sciences, vol. 8, no. 2, pp. 54-62, 2. 1983.
pISSN : 1226 - 4717
eISSN : 2287 - 3880