Low-Frequency Electromagnetic Leakage Signal Analysis According to Fundamental Operations of Smartphones 


Vol. 41,  No. 9, pp. 1108-1119, Sep.  2016


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  Abstract

This paper presents the spectral analysis and radiation pattern of low-frequency electromagnetic(EM) leakage signals according to the fundamental operations of smartphones. The EM leakage signals generated by the activation of four I/O sensor modules such as a touch-screen, a camera, a microphone and a speaker are captured by the commercial near-field magnetic probe with 1cm spatial resolution. The analysis results show that the leakage of the EM wave occurs strongly around the activated I/O sensor modules, AP(Application Processor) and memory modules. Also, the distinguishable frequency characteristic is shown in each spectrum of EM leakage signals.

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  Cite this article

[IEEE Style]

Y. Lee, H. Park, Y. Kwon, J. Lee, J. Choi, S. Cho, "Low-Frequency Electromagnetic Leakage Signal Analysis According to Fundamental Operations of Smartphones," The Journal of Korean Institute of Communications and Information Sciences, vol. 41, no. 9, pp. 1108-1119, 2016. DOI: .

[ACM Style]

Young-Jun Lee, Heesun Park, YoungHyoun Kwon, Jaeki Lee, Ji-Eun Choi, and Sangwoo Cho. 2016. Low-Frequency Electromagnetic Leakage Signal Analysis According to Fundamental Operations of Smartphones. The Journal of Korean Institute of Communications and Information Sciences, 41, 9, (2016), 1108-1119. DOI: .

[KICS Style]

Young-Jun Lee, Heesun Park, YoungHyoun Kwon, Jaeki Lee, Ji-Eun Choi, Sangwoo Cho, "Low-Frequency Electromagnetic Leakage Signal Analysis According to Fundamental Operations of Smartphones," The Journal of Korean Institute of Communications and Information Sciences, vol. 41, no. 9, pp. 1108-1119, 9. 2016.

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pISSN : 1226 - 4717
eISSN : 2287 - 3880