A Study on M-pattern Abnormal Conductivity of CNT/PDMS Piezoresistance Sensor 


Vol. 43,  No. 10, pp. 1711-1717, Oct.  2018
10.7840/kics.2018.43.10.1711


PDF
  Abstract

In this paper, we try to analyze the abnormal conductivity phenomenon of the M pattern of the bulk type CNT/PDMS prezoresistance sensor. In order to analyze this pattern, the flow of conductivity inside the piezoresistive sensor is investigated through the 3D percolation network. The abnormal variation of conductivity is explained by two phenomenon. When pressure is applied to the sensor, (1) CNT deformation occurs due to the distance of the CNT-CNT approaching. (2) As the distance between CNT-CNT due to bulging becomes distant, the tunneling breaks. We also propose a method to vertically aligning CNTs to prevent M-shaped pattern.

  Statistics
Cumulative Counts from November, 2022
Multiple requests among the same browser session are counted as one view. If you mouse over a chart, the values of data points will be shown.


  Cite this article

[IEEE Style]

H. Oh, S. Baek, J. Kwon, "A Study on M-pattern Abnormal Conductivity of CNT/PDMS Piezoresistance Sensor," The Journal of Korean Institute of Communications and Information Sciences, vol. 43, no. 10, pp. 1711-1717, 2018. DOI: 10.7840/kics.2018.43.10.1711.

[ACM Style]

Hyun-Woo Oh, Seung-Won Baek, and Joo-Yeok Kwon. 2018. A Study on M-pattern Abnormal Conductivity of CNT/PDMS Piezoresistance Sensor. The Journal of Korean Institute of Communications and Information Sciences, 43, 10, (2018), 1711-1717. DOI: 10.7840/kics.2018.43.10.1711.

[KICS Style]

Hyun-Woo Oh, Seung-Won Baek, Joo-Yeok Kwon, "A Study on M-pattern Abnormal Conductivity of CNT/PDMS Piezoresistance Sensor," The Journal of Korean Institute of Communications and Information Sciences, vol. 43, no. 10, pp. 1711-1717, 10. 2018. (https://doi.org/10.7840/kics.2018.43.10.1711)

Search
(IN TITLE, AUTHOR, ABSTRACT,KEYWORDS)

Advanced Search ▼

POPULAR KEYWORDS
(TOP 10 KEYWORDS)

Recent Publications
(LAST 3 YEARS)






pISSN : 1226 - 4717
eISSN : 2287 - 3880