Arbitrary Sample Rate Conversion Architecture for High Output Sample Rate 


Vol. 44,  No. 7, pp. 1248-1256, Jul.  2019
10.7840/kics.2019.44.7.1248


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  Abstract

This paper proposes an architecture of digital arbitrary sample rate conversion for high output sample rate and shows the performance through simulation. In order to transmit and receive signals at various data rates in a communication system, an arbitrary sampling rate must be generated. The SRC is a method of adjusting the sampling rate. The most basic SRC requires an analog circuit as a resampling method after signal reconstruction. There are other methods such as L/M SRC and fractional SRC using delay-estimation. Although these methods can generate an arbitrary sampling rate, there are drawbacks to each method. In particular, when the SRC is implemented in a communication system, it is so difficult to consider the synchronization between the data rate and the sampling rate. So we propose a digital arbitrary SRC architecture that can be implemented more easily. In this paper, we implement the proposed architecture and shows the performance with simulation as a result.

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  Cite this article

[IEEE Style]

J. Choi, T. Yi, J. Kw, J. Ahn, B. Kim, "Arbitrary Sample Rate Conversion Architecture for High Output Sample Rate," The Journal of Korean Institute of Communications and Information Sciences, vol. 44, no. 7, pp. 1248-1256, 2019. DOI: 10.7840/kics.2019.44.7.1248.

[ACM Style]

Jong-Won Choi, TaekJoon Yi, Joo-Hyeok Kw, Jooeon Ahn, and Bokki Kim. 2019. Arbitrary Sample Rate Conversion Architecture for High Output Sample Rate. The Journal of Korean Institute of Communications and Information Sciences, 44, 7, (2019), 1248-1256. DOI: 10.7840/kics.2019.44.7.1248.

[KICS Style]

Jong-Won Choi, TaekJoon Yi, Joo-Hyeok Kw, Jooeon Ahn, Bokki Kim, "Arbitrary Sample Rate Conversion Architecture for High Output Sample Rate," The Journal of Korean Institute of Communications and Information Sciences, vol. 44, no. 7, pp. 1248-1256, 7. 2019. (https://doi.org/10.7840/kics.2019.44.7.1248)

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pISSN : 1226 - 4717
eISSN : 2287 - 3880