On Designing Domino CMOS Circuits for High Testability
Vol. 19, No. 3, pp. 401-417, Mar. 1994
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Cite this article
[IEEE Style]
이재민 and 강성모, "On Designing Domino CMOS Circuits for High Testability," The Journal of Korean Institute of Communications and Information Sciences, vol. 19, no. 3, pp. 401-417, 1994. DOI: .
[ACM Style]
이재민 and 강성모. 1994. On Designing Domino CMOS Circuits for High Testability. The Journal of Korean Institute of Communications and Information Sciences, 19, 3, (1994), 401-417. DOI: .
[KICS Style]
이재민 and 강성모, "On Designing Domino CMOS Circuits for High Testability," The Journal of Korean Institute of Communications and Information Sciences, vol. 19, no. 3, pp. 401-417, 3. 1994.
pISSN : 1226 - 4717
eISSN : 2287 - 3880