A Joint Sensing and Decoding for Improving the Hard-Decision Lifetime of NAND Flash Memories 


Vol. 49,  No. 6, pp. 816-824, Jun.  2024
10.7840/kics.2024.49.6.816


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  Abstract

Soft-decision decoding schemes are utilized for high data reliability of NAND flash memories. However, it requires excessive latency and power consumption compared to hard-decision (HD) decoding schemes. This work proposes a novel joint sensing and decoding scheme to extend the HD decoding lifetime. When the HD decoding fails, the proposed scheme re-reads HD channel outputs and judiciously combines the two consecutive HD readings utilizing reliability information from the failed HD decoding. Since the random telegraph noises impairing HD readings are statistically independent, the combining provides a diversity gain. Numerical results show that the proposed scheme significantly improves the HD lifetime.

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[IEEE Style]

S. Han, I. Ali, J. Ha, "A Joint Sensing and Decoding for Improving the Hard-Decision Lifetime of NAND Flash Memories," The Journal of Korean Institute of Communications and Information Sciences, vol. 49, no. 6, pp. 816-824, 2024. DOI: 10.7840/kics.2024.49.6.816.

[ACM Style]

Seokju Han, Inayat Ali, and Jeongseok Ha. 2024. A Joint Sensing and Decoding for Improving the Hard-Decision Lifetime of NAND Flash Memories. The Journal of Korean Institute of Communications and Information Sciences, 49, 6, (2024), 816-824. DOI: 10.7840/kics.2024.49.6.816.

[KICS Style]

Seokju Han, Inayat Ali, Jeongseok Ha, "A Joint Sensing and Decoding for Improving the Hard-Decision Lifetime of NAND Flash Memories," The Journal of Korean Institute of Communications and Information Sciences, vol. 49, no. 6, pp. 816-824, 6. 2024. (https://doi.org/10.7840/kics.2024.49.6.816)
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pISSN : 1226 - 4717
eISSN : 2287 - 3880