IoT-Based Traceability Data Management for Electronic Scales
Vol. 48, No. 12, pp. 1685-1688, Dec. 2023
10.7840/kics.2023.48.12.1685
Abstract
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Cite this article
[IEEE Style]
C. Lim and Y. Jeon, "IoT-Based Traceability Data Management for Electronic Scales," The Journal of Korean Institute of Communications and Information Sciences, vol. 48, no. 12, pp. 1685-1688, 2023. DOI: 10.7840/kics.2023.48.12.1685.
[ACM Style]
Chaewon Lim and Youchan Jeon. 2023. IoT-Based Traceability Data Management for Electronic Scales. The Journal of Korean Institute of Communications and Information Sciences, 48, 12, (2023), 1685-1688. DOI: 10.7840/kics.2023.48.12.1685.
[KICS Style]
Chaewon Lim and Youchan Jeon, "IoT-Based Traceability Data Management for Electronic Scales," The Journal of Korean Institute of Communications and Information Sciences, vol. 48, no. 12, pp. 1685-1688, 12. 2023. (https://doi.org/10.7840/kics.2023.48.12.1685)
Vol. 48, No. 12 Index