Interleaver Design of Punctured RA-Type LDPC Codes 


Vol. 31,  No. 12, pp. 1129-1134, Dec.  2006


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  Abstract

In this paper, we analyze the cycle structure of punctured finite-length RA-type LDPC codes and design interleavers which have good memory efficiency and avoid short cycles. Furthermore, we introduce the check-node merging scheme for punctured finite-length RA-type LDPC codes and design simple interleavers. Simulation results show that punctured finite-length RA-type LDPC codes using the proposed simple interleavers have better performance than those with random and S-random interleavers.

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  Cite this article

[IEEE Style]

Y. Piao and D. Shin, "Interleaver Design of Punctured RA-Type LDPC Codes," The Journal of Korean Institute of Communications and Information Sciences, vol. 31, no. 12, pp. 1129-1134, 2006. DOI: .

[ACM Style]

Yong-Chun Piao and Dong-Joon Shin. 2006. Interleaver Design of Punctured RA-Type LDPC Codes. The Journal of Korean Institute of Communications and Information Sciences, 31, 12, (2006), 1129-1134. DOI: .

[KICS Style]

Yong-Chun Piao and Dong-Joon Shin, "Interleaver Design of Punctured RA-Type LDPC Codes," The Journal of Korean Institute of Communications and Information Sciences, vol. 31, no. 12, pp. 1129-1134, 12. 2006.

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pISSN : 1226 - 4717
eISSN : 2287 - 3880