Feature Extraction using DLL/API Statistical Analysis and Malware Detection based on Machine Learning
Vol. 43, No. 4, pp. 730-739, Apr. 2018
10.7840/kics.2018.43.4.730
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Cite this article
[IEEE Style]
J. Ha, S. Kim, T. Lee, "Feature Extraction using DLL/API Statistical Analysis and Malware Detection based on Machine Learning," The Journal of Korean Institute of Communications and Information Sciences, vol. 43, no. 4, pp. 730-739, 2018. DOI: 10.7840/kics.2018.43.4.730.
[ACM Style]
Ji-hee Ha, Su-jeong Kim, and Tae-jin Lee. 2018. Feature Extraction using DLL/API Statistical Analysis and Malware Detection based on Machine Learning. The Journal of Korean Institute of Communications and Information Sciences, 43, 4, (2018), 730-739. DOI: 10.7840/kics.2018.43.4.730.
[KICS Style]
Ji-hee Ha, Su-jeong Kim, Tae-jin Lee, "Feature Extraction using DLL/API Statistical Analysis and Malware Detection based on Machine Learning," The Journal of Korean Institute of Communications and Information Sciences, vol. 43, no. 4, pp. 730-739, 4. 2018. (https://doi.org/10.7840/kics.2018.43.4.730)