A YAML-Based Profiler for Designing SFC Tests
Vol. 44, No. 12, pp. 2303-2308, Dec. 2019
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Abstract
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Cite this article
[IEEE Style]
T. Nguyen and M. Yoo, "A YAML-Based Profiler for Designing SFC Tests," The Journal of Korean Institute of Communications and Information Sciences, vol. 44, no. 12, pp. 2303-2308, 2019. DOI: 10.7840/kics.2019.44.12.2303.
[ACM Style]
Trinh Nguyen and Myungsik Yoo. 2019. A YAML-Based Profiler for Designing SFC Tests. The Journal of Korean Institute of Communications and Information Sciences, 44, 12, (2019), 2303-2308. DOI: 10.7840/kics.2019.44.12.2303.
[KICS Style]
Trinh Nguyen and Myungsik Yoo, "A YAML-Based Profiler for Designing SFC Tests," The Journal of Korean Institute of Communications and Information Sciences, vol. 44, no. 12, pp. 2303-2308, 12. 2019. (https://doi.org/10.7840/kics.2019.44.12.2303)